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Research

Advanced Characterization Center (ACC)

Advanced Characterization Center (ACC)

Since the establishment, YICT has made an effort to furnish top-level research facilities and equipment for studies of nano-tech, biomedical, energy, and information technology. Through such an effort over two years, it became to set up more than 20 state-of-the-art equipment, and established Advanced Characterization Center (ACC). The center owns surface analysis devices (e.g. Cs-corrected STEM, FE-SEM, HR-XRD, AFM), chemical analyzers (TOF-SIMS, XPS), spectral analytical instruments (e.g. Raman spectrometer, FT-IR), and sampling machines (e.g. FIB, PIPS). After the setup period which tested replicability of analysis and stability of instruments, ACC runs various analysis services for external sources as well as other labs in YICT. Currently, ACC is conducting more than 160 analysis services every month.

Surface analysis: Accelerated electron beam or ion beam is used for the analysis what happened in the area corresponding to the number nm (or ~ μm) from the solid surface, which can identify the compositional and structural properties of the surface layer. TEM (transmission electron microscope) provides information on the crystal structure, defects, diffraction patterns through an interaction between the incident electron beam and sample. Characteristic X-rays and energy-loss electron that occurs at the same time is used for compositional analysis. The resolution of TEM with a probe Cs-corrector is 78 pm.

Equipment: Cs-corrected STEM( Cs-corrected Scanning Transmission Electron Microscope), HR-XRD(High Resolution X-ray Diffractometer), FE-SEM(Field Emission-Scanning Electron Microscope), FIB(Focused Ion Beam), AFM(Atomic Force Microscope)

Chemical analysis: Chemical analysis is used to confirm the elements, molecules and ion. And it is possible to determine the relative amount of the particular component in the material. Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) is the mass spectrometry of ionized particles which emitted when a surface is bombared by energetic primary particle, usually ions (Bin+, O2+, Cs+). It provides detailed elemental and molecular information about surface, thin layer, interfaces. TOF-SIMS is capable of three basic modes of operation; surface spectroscopy, surface imaging, Depth profiling.

Equipment: TOF-SIMS(Time of Flight Secondary Ion Mass Spectrometer), XPS(X-ray Photoelectron Spectrometer), SDT(Simultaneous DSC/TGA), Zetasizer, LIBS(Laser Induced Breakdown Spectroscopy)

Spectral analysis: Spectral analysis include ultraviolet, visible, infrared and raman spectroscopy. It is quantitative and qualitative method using various light source. Especially, the spectrum is used to confirm energy level, transition probability, molecular structure and molecular distance. Raman spectroscopy is observed as inelastically scattered light, allows for the interrogation and identification of vibrational (phonon) states of molecules. Raman spectrometer is used in many varied applications, including characterization of graphene/CNT materials, pharmaceutics, forensics, geology, materials and life science.

Equipment: Raman Spectrometer, UV-Vis-NIR Spectrophotometer FT-IR Spectrometer

첨단분석센터

People
Principal Investigator:
  • Jong-Souk Yeo, Ph.D. (jongsoukyeo@yonsei.ac.kr) - CENTER HEAD

Senior Researchers:
  • Jinyoung Moon, Ph.D. (moonjy@yonsei.ac.kr)

Associate Researchers:
  • Haemin Choi (chm22@yonsei.ac.kr)
  • Mihee Kim (gimme@yonsei.ac.kr)
  • Suhyun Kim (suhyunkim@yonsei.ac.kr)
  • Heesun Lee (lee.hs@yonsei.ac.kr)